Advanced VLSI Design and Testability Issues

Tripathi, Suman LataEditeurSaxena, SobhitEditeurMohapatra, Sushanta KumarEditeur

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Description

This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.

Détails

ISBN/GTIN978-0-367-53836-1

Type de produitLivre

ReliureCartonné

ÉditeurTaylor & FrancisCRC Press

Date de parution15.04.2022

Edition1. A.

Pages360 pages

LangueAnglais

DimensionsLargeur 156 mm, Hauteur 234 mm

Poids680 g

IllustrationsFarb., s/w. Abb.

N° article14798925

CataloguesBuchzentrum

Source des données n°36522043

Plus de détails

Auteur

Tripathi, Suman LataEditeurSaxena, SobhitEditeurMohapatra, Sushanta KumarEditeur

Suman Lata Tripathi is associated with Lovely Professional University, Phagwara, Punjab, as Professor with more than seventeen years of experience in academics. Her area of expertise includes microelectronics device modeling and characterization, low power VLSI circuit design, VLSI design of testing and advance FET design for IOT and biomedical applications etc. Sobhit Saxena is an Associate Professor at Lovely Professional University University, Phagwara, Punjab. His area of expertise includes nanomaterial synthesis and characterization, electrochemical analysis and modeling and simulation of CNT based interconnects for VLSI circuits. S. K. Mohapatra is working as Assistant Professor, in School of Electronics Engineering, Kalinga Institute of Industrial Technology, Bhubaneswar. His research interests include Modeling and Simulation of Nanoscale Devices and its application in IoT. Energy efficient Wireless Sensor Networking, Adhoc Networks, Cellular Communications, Metamaterial absorbers in THz application, UWB-MIMO Antenna, Reconfigurable Antenna, Performance enhancement for high frequency.